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Open Positions

This page contains informations on all the participants of the NanoSNOM network. You can send e-mail to all of them or access their home pages.

List of Participants:

University of Ulm
Abteilung Experimentelle Physik
Prof. Dr. Othmar Marti, coordinator
University of Basel
Institute of Physics
Prof. Dr. H.-J. Güntherodt
Dr. Dieter Pohl
University of Dublin
Trinity College
Dr. Igor Shvets
Karl-Franzens-Universität Graz
Institut für Experimentalphysik
Prof. Dr. F. Aussenegg
Consejo Superior de Investigaciones Cientificas Madrid
Prof. Dr. Nicolas Garcìa
Consejo Superior de Investigaciones Cientificas, Madrid
Prof. Dr. Manuel Nieto-Vesperinas
Ecole Centrale Paris / CNRS, CRSA, Paris
Prof. Dr. Jean-Jacques Greffet
Instituto Nazionale per la Fisica della Materia,  Pisa
Prof. Dr. Maria Allegrini

University of Ulm UNI.gif (4202 Byte)
Abteilung Experimentelle Physik, Prof. Dr. Othmar Marti

D-89069 Ulm, Germany
Phone: +49 (731) 50 23011
Fax: +49 (731) 50 23036

Objective of the joint research should be the understanding of the dynamics of the imaging process in near field optics. Emphasis should be put on identifying the key physical aspects which determine resolution, usability and time resolution. Time resolved SNOM measurements and a colour SNOM will be used.

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University of Basel

Uni Basel,
Physics Department, Condensed Matter, Prof. Dr. H.-J. Güntherodt

Institut für Physik der Universität Basel
Klingelbergstr. 82
CH-4056 Basel
Phone +41 (61) 267 37 67
Fax +41 (61) 267 37 84
Prof. Dr. H.-J. Güntherodt

In the pursuit of the above goals, the different NFO techniques developed in recent years shall be compared, assessed, consolidated, and improved. The main goals are

reliability and ease of operation,
assessment of storage potential,
increased resolution.
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Trinity College of Dublin

Department of Physics, Dr. I. V. Shvets

Dublin 2
Phone:  +353 (1) 6081653
Fax: +353 (1) 671 1759
Dr. I.V. Shvets

Development of coaxial type probes of sub-100 nm size for high light throughput. Demonstration of the performance of the probes on conventional test structures.

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Karl-Franzens-Universität Graz

Institut für Experimentalphysik, Prof. Dr. Franz R. Aussenegg  | Fakultät |

Universitätsplatz 5
A-8010 Graz
Phone: +43 (316) 380- 5186
Fax: +43 (316) 380-9816

Objective of the joined research should be the development of nanometric structures with specifically designed far-field and near-field optical properties and corresponding far- and near-field optical methods for their investigation. Theoretical models should be developed in order to calculate the optical response of the structure and the influence of the measuring probe.

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Consejo Superior de Investigaciones Cientificas Madrid: LFSP

logo del CSIC
LFSP, Prof. Dr. Nicolas García

Serrano 144
E-28006 Madrid
Phone: +34 (1) 563 17 74
Fax: +34 (1) 563 15 60

Objective of the joint research should be the "nanowriting" of lines on ferroelectric surfaces and the detection of these ones. We could use the SNOM fibre tip as a nanoscopic light source and the capability of the microscope to obtain shear force topographical images to detect these lines. In order to improve the size resolution we will also utilise other techniques such as AFM and SEM. Using physical properties of ferroelectric used in these experiments we can develop a possible device without connections. Additionally, theoretical simulations will test previous theories and will be used to include new image reconstruction techniques in SNOM experiments.

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Consejo Superior de Investigaciones Cientificas, Madrid: ICMM

logo del CSIC
ICMM, Prof. Dr. Manuel Nieto-Vesperinas

C.I.S.C. Cantoblanco
28049 Madrid
Phone: +34 (1) 334 9044
Fax.: +34 (1) 3720623

Objective of the joint research will be a model study of the imaging process with apertureless techniques, and the read-out process of optical disk storage: correlation between signal and topography, or groove profile and position. Also, influence of groove defects on the read-out signal.

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Ecole Centrale Paris / CNRS, CRSA, Paris

Ecole Centrale Paris / CNRS, Prof. Dr. Jean-Jacques Greffet

Greffet, Jean-Jacques
Grande Voie des Vignes
F-92295 Chatenay-Malabry
Phone: +33 (1) 41 13 10 61
Fax: +33 (1) 47 02 80 35

The present project is intended to push the effort of understanding the basic mechanisms underlying near-field optical technology.

Major progress has been made on the experimental set-ups. Yet, several ideas and concepts have been taken for granted. Recently, artefacts have been demonstrated. It is necessary to re-examine any component of the set-ups and to this aim, a basic understanding of the physics is necessary.

Particular issues are :

  1. The investigation of the different feed-back controls and their implications on the image formation.

  2. Is it possible to suppress artefacts due to feedback control ?

  3. What are the resolution limits ?

  4. Is it possible to analyse theoretically the potential performances of the different set-ups ?

  5. Implications of reciprocity in near-field.

  6. Is it possible to define a transfer function for illumination SNOM ?

  7. To what extent the inverse problem can be solved in illumination SNOM ?

  8. What are the optimal working conditions ? (coherence, angles of detection, polarisation, etc.)

The above program is the necessary work to attack on a firm basis the problem of designing systems with good resolutions for e.g. information storage.

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Instituto Nazionale per la Fisica della Materia Pisa

infm.gif (953 Byte)
Probe Microscopy Laboratory,Prof. Dr. Maria Allegrini wpe1.jpg (6061 Byte)

Piazza Torricelli, 2
56126 Pisa
Phone: +39 (50) 911 285
Fax: +39 (50) 48 277

Objective of the joint research is the development of a faster tip-sample distance control in SNOM for data storage applications. The achieved bandwidth will be assessed by means of test samples produced in the framework of the project, whereas read/write rate will be tested by means of suitable ferroelectric thin films produced by Pulsed Laser Deposition (PLD) or provided by other partners of the project. Optimal wavelength for the read/write process will be determined on different ferroelectric materials.

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Last Revision: 2000-07-13.